
System Characterization 1 System Overview
System Reference, January 2001
21
Figure 4 SOC System Integration
In order to achieve this high level of integration, all
components are water-cooled. By keeping the junction
temperature close to the stabilized water temperature, all
components of the test system which are critical for accu-
racy operate under very narrow and well-defined condi-
tions. This leads to minimized drift of all system
parameters during the entire calibration interval and
consequently to superior reliability.
More Highlights More highlights of the SOC Series are:
• 112M vectors SDRAM vector memory
Maximum of 256 k sequencer instructions SRAM. The
sets containing your test data are also stored in the
SRAM. This reduces the memory available for
sequencer instructions. So the actual number of
sequencer instructions you can store in the SRAM will
be lower than the maximum of 256 k.
• 625 MHz maximum clock frequency
• Higher accuracy than the Agilent 83000 F-Series
• PMU per pin (parallel P/F results, and multiplexed
value measurement per 16 pins)
• High Precision PMU per cardcage (128 pins)
• An active load per pin
Digital
Cards
Analog
Cards
DC/DC Converters
(in testhead)
AC/DC Converters
(in support rack)
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